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Investigating the Causes of Congestion on the African IXP substrate
This slideset was presented at: ACM Internet Measurement Conference (IMC) (November 2017)
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Investigating the Causes of Congestion on the African IXP substrate

Rodérick Fanou
IMDEA Networks Institute and
University Carlos III of Madrid

Keywords: active data analysis, congestion, measurement methodology, topology
  Last Modified: Mon Nov-6-2017 10:38:49 PST
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